Preserve your samples and get every analysis right the first time
Acid has long been the preferred option for semiconductor decapsulation. But it’s too harsh and clumsy to ensure the accuracy of your failure analysis or preserve your samples. You have probably experienced these challenges in your work:
- You struggle to preserve sample evidence.
- You feel pressure on time, cost and talent.
- You’re tired of seeing samples damaged beyond usability.
It’s a similar story in labs everywhere. Evolving your lab away from the acid method resolves all these headaches.
There is an alternative: highly selective Microwave-Induced Plasma (MIP) technology
The MIP method only removes the material it needs to during decapsulation. This keeps your samples pristine and ensures every analysis you do goes right the first time.
MIP technology helps you find the right answers. Answers that will only become more valuable as semiconductors and their uses continue to evolve. So equip your lab teams with the technology they need to get those answers consistently right.
In this whitepaper, we’ll share more about our MIP technology and explore:
1. Market trends impacting decapsulation
Semiconductor complexity, environmental and workplace safety, lab talent shortages.
2. The rise of time pressure for decapsulation
Golden samples mean no room for error, with time, cost and reputation on the line.
3. The importance of accuracy vs. speed
Acid might be quick, but it can cost you in the long run.
Comparing methods to guarantee accurate, reliable semiconductor failure analysis.